This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...

At its simplest, a scope probe provides a physical and an electrical connection between a device or circuit under test and an oscilloscope's input amplifier. These days, most engineers and technicians ...

Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...

The increase in switching speed offered by GaN transistors requires good measurement technology, as well as good techniques to capture important details of high-speed waveforms. This article focuses ...