The market growth is driven by increasing semiconductor testing volumes, advanced node scaling, rising adoption of high-frequency and fine-pitch probes, and expanding OSAT and wafer-level testing ...
If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...
With a nod to user frustration, the CL-QFE44SE-T-01 test adapter clip allows probing of a 44-pin, 0.8-mm pitch QFP device with reliable spring pins. Probing is accomplished with the target chip in ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback