A number of articles have been written to illustrate how automating scanning electron microscopy (SEM) imaging can save precious time for both researchers and operators. Scanning electron microscopes ...

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In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

With low particulate loading common in stack emissions these days, particulate matter measurement can be difficult using traditional techniques. Microscopical measurement of particle-size ...

Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

Pharmaceutical research includes developing new drugs or constantly improving existing drugs. This versatile research topic is an extensive field of study handling an increasing number of challenges, ...